Texas Instruments Placement Papers, Test Pattern and Syllabus – FACE Prep
Texas Instruments Placement Papers
The Texas Instruments Test is the first round of the Texas Instruments Recruitment Process for campus placements. For off-campus hiring, the initial shortlisting is based on the candidate’s resume. This article provides comprehensive details about Texas Instruments placement papers, including the test pattern, syllabus, marking scheme, and cut-off requirements to clear the test.
Texas Instruments Selection Procedure
The recruitment process for Texas Instruments includes the following stages:
Texas Instruments Test
Technical Interview
HR Interview
Texas Instruments Test
The Texas Instruments Test is an aptitude and technical assessment designed to evaluate a candidate’s intelligence and core subject knowledge. It consists of the following sections:
Aptitude Section
Analog Section
Digital Section
Key Notes:
The Analog and Digital Design sections determine a candidate’s suitability for respective profiles.
Candidates clearing the cut-off for both sections can apply for both profiles.
Cut-off: Typically 55-60%.
Negative Marking: Avoid guesswork.
Texas Instruments Test Syllabus
1. Aptitude Section
This section assesses quantitative aptitude, verbal ability, and logical reasoning. Key topics include:
Time, Speed, and Distance
Time and Work
Probability
Permutation and Combination
Syllogism
Patterns
Synonyms and Antonyms
Reading Comprehension
Tip: Visit APTIPEDIA for a detailed aptitude syllabus and practice materials.
2. Analog Design
The Analog Design section evaluates fundamental and advanced concepts. Focus on the following topics:
Network Analysis
Operational Amplifiers (Op-Amps)
Amplifiers
Diodes
Basic BJT Circuits
ICs, FETs, JFETs, MOSFETs
Transistors
Filters
Analog Signal Processing
Analog System Design
Waveforms
3. Digital Design
This section focuses on digital concepts studied in college. Prepare the following topics:
Signals and Systems
Digital Signal Processing
Digital Circuits and Design
Microelectronics
Control Systems
Transient Analysis of Networks
Sample Questions from Previous Papers
Palindrome Date
If the date is written as MMDDYYYY, Oct 2, 2001, is 10022001, a palindrome. What is the immediate palindrome before this date?
Clock Hands Meeting
The time is 12:00. How often will the minute hand meet the hour hand?
Bee and Trains Problem
Two trains travel at 100 mph each through a 200-mile tunnel in opposite directions. A supersonic bee starts at the tunnel, touches each train alternately until collision. Find the distance traveled by the bee.
Logic Gate Implementation
Minimum number of 2-input NAND gates required to implement: Y = AB + CD + EF?
Memory Hierarchy
In a two-level memory system, M1 is accessed first with a miss penalty of 100 nanoseconds and an access time of 2 nanoseconds. The probability of valid data in M1 is 0.97. What is the average memory access time?
Interrupt Latency
Interrupt latency is the time elapsed between: A. Occurrence of an interrupt and its detection by the CPU B. Assertion of an interrupt and the start of the ISR C. Assertion of an interrupt and the completion of the ISR D. Start and completion of the ISR
Universal Logic Set
Which combination does not form a universal logic set? A. 2-input AND + 2-input OR B. 2-to-1 multiplexer C. 2-input XOR + inverter D. 3-input NAND
Instruction Op-Code Length
A CPU with 16 registers and 5 addressing modes. Correct op-code length in bits?
Diode Problem
Given V1 = 8V and V2 = 8V, which diode will conduct? A. D1 only B. D2 only C. Both D1 and D2 D. Neither D1 nor D2
Diode and Resistor
A forward voltage of 9V is applied to a diode in series with a 1kΩ resistor. The voltage across the resistor is zero. Why?
Oscillator Phase Shift
For a system to work as an oscillator, the total phase shift of the loop gain must be: A. 90° B. 45° C. 270° D. 360°
Recommended Programs
Basic Array Operations (Insert, Delete, Search)
Smallest and Largest Element in an Array
Sum of Elements in an Array
Sorting Array Elements
Non-Repeating and Repeating Elements in an Array
Suggested Visuals
Flowcharts for each section of the test pattern.
Graphs showcasing cut-off trends and success rates.
Tables summarizing the syllabus for easy reference.